F02000 - SEMI F20 - 用于通用、高纯和超高纯半导体制造组件的316L不锈钢棒材、锻材、挤压型材、板材和管材的规范 Revision:SEMI F20-0706E (Reapproved 0917) - Superseded This Practice includes adjusting the

This Practice includes adjusting the microscope for Kohler illumination

The limit of detection is determined by either the BLANK value or by count rate limitations

8 mm × 202

These requirements are consistent with the requirements of SEMI M45

F02000 - SEMI F20 - 用于通用、高纯和超高纯半导体制造组件的316L不锈钢棒材、锻材、挤压型材、板材和管材的规范 Revision:SEMI F20-0706E (Reapproved 0917) - Superseded This Practice includes adjusting theNOTICE: This translation is a REFERENCE COPY ONLY. If differences should exist between the English version and a translation in any other language, the English version is the official and authoritative version. 316L ASTM A276ASTM A240ASTM A269ASTM A632316L