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SEMI E114-0302E (editorial revision)
SEMI D11 — Specification for Flat Panel Display Glass Substrate Cassettes
1-0308 (technical revision)
single crystal polished silicon wafers used for gallium nitride-on-silicon applications
D03000 - SEMI D30 - Test Method for Light Resistance in Flat Panel Display (FPD) Color Filters StdPbc-1122 SEMI E114-0302E (editorial revision)1 Purpose 1. 1 The purpose of this Test Method is to standardize the method for measurement of light resistance in color filters used for flat panel displays (FPD). 2 Scope 2. 1 This Test Method is to be used by suppliers and users of FPD color filters to measure quality in products as well as items under development. 2. 2 This Test Method shall be used in general FPD production to test the resistance of color filters to light. Referenced SEMI
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